Browsing Rensselaer Libraries by Author "Cale, Timothy S."
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A computational framework for modeling grain structure development in three dimensions
Bloomfield, Max O. (Rensselaer Polytechnic Institute, Troy, NY, 2007-08) -
Critical adhesion energy determination of low K dielectrics using four point bending
Kulkarni, Ameet (Rensselaer Polytechnic Institute, Troy, NY, 2006-05)The critical adhesion energies of BCB/PECVD SiO2, BCB (with AP)/Si, porous MSQ/Ta and PaN pore sealed MSQ/Ta were determined using four point bending. The interfacial adhesion energy of BCB/PECVD SiO2 is estimated to be 5 ...