Author
Crist, David
Other Contributors
Lewis, Daniel J.; Huang, Liping; Ullal, Chaitanya;
Date Issued
2017-08
Subject
Materials engineering
Degree
MS;
Terms of Use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.;
Abstract
Recent studies conducted with sharp-interface models suggest a link between the spatial distribution of grain size variance and average grain growth rate. This relationship and its effect on grain growth rate was examined using the diffuse-interface Phase Field Method on a series of microstructures with different degrees of grain size gradation. Results from this work indicate that the average grain growth rate has a positive correlation with the average grain size dispersion for phase field simulations, confirming previous observations. It is also shown that the grain growth rate in microstructures with skewed grain size distributions is better measured through the change in the volume-weighted average grain size than statistical mean grain size. This material is based upon work supported by the National Science Foundation under Grant No. 1334283. The NSF project title is “DMREF: Real Time Control of Grain Growth in Metals” and was awarded by the Civil, Mechanical and Manufacturing Innovation division under the Designing Materials to Revolutionize and Engineer our Future (DMREF) program.;
Description
August 2017; School of Engineering
Department
Dept. of Materials Science and Engineering;
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection;
Access
Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.;