Coupled volume analysis with a high resolution measurement system
Authors
Lee, Joonhee
ORCID
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Other Contributors
Xiang, Ning
Braasch, Jonas
Braasch, Jonas
Issue Date
2009-12
Keywords
Architectural sciences
Degree
MS
Terms of Use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
Full Citation
Abstract
Description
December 2009
School of Architecture
School of Architecture
Department
School of Architecture
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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