Coupled volume analysis with a high resolution measurement system

dc.rights.license	Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributor	Xiang, Ning
dc.contributor	Braasch, Jonas
dc.contributor.author	Lee, Joonhee
dc.date.accessioned	2021-11-03T09:38:41Z
dc.date.available	2021-11-03T09:38:41Z
dc.date.created	2009-12-09T15:40:40Z
dc.date.issued	2009-12
dc.identifier.uri	https://hdl.handle.net/20.500.13015/2827
dc.description	December 2009
dc.description	School of Architecture
dc.language.iso	ENG
dc.publisher	Rensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartof	Rensselaer Theses and Dissertations Online Collection
dc.subject	Architectural sciences
dc.title	Coupled volume analysis with a high resolution measurement system
dc.type	Electronic thesis
dc.type	Thesis
dc.digitool.pid	20160
dc.digitool.pid	20161
dc.digitool.pid	20163
dc.digitool.pid	20162
dc.digitool.pid	20164
dc.rights.holder	This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degree	MS
dc.relation.department	School of Architecture

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