Development of a novel method for measuring chromium vaporization from SOFC interconnect materials

Authors
Willson, Patrick Daniel
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Other Contributors
Lewis, Daniel J.
Issue Date
2009-12
Keywords
Materials science
Degree
ME
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This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
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Abstract
Description
December 2009
School of Engineering
Department
Dept. of Materials Science and Engineering
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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