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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorLu, James
dc.contributor.authorZhang, Dingyou
dc.date.accessioned2021-11-03T09:59:59Z
dc.date.available2021-11-03T09:59:59Z
dc.date.created2010-08-09T14:07:10Z
dc.date.issued2010-08
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3059
dc.descriptionAugust 2010
dc.descriptionSchool of Engineering
dc.descriptionCenter for Integrated Electronics
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectElectrical engineering
dc.titleGrowth and characterization of vertically aligned carbon nanotubes for interconnect applications
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid24681
dc.digitool.pid24682
dc.digitool.pid24684
dc.digitool.pid24683
dc.digitool.pid24685
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Electrical, Computer, and Systems Engineering


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