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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorMartin, Lealon L.
dc.contributorCoppens, Marc-Olivier
dc.contributorBequette, B. Wayne
dc.contributorOzisik, Rahmi
dc.contributor.authorTolle, Ian
dc.date.accessioned2021-11-03T10:05:54Z
dc.date.available2021-11-03T10:05:54Z
dc.date.created2011-01-21T10:08:59Z
dc.date.issued2010-12
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3161
dc.descriptionDecember 2010
dc.descriptionSchool of Engineering
dc.descriptionComputational Center for Nanotechnology Innovations
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectChemical and biological engineering
dc.titleQuantifying multi-scale network process-structure-property relationships in polymer materials through scattering data decomposition
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid26798
dc.digitool.pid26799
dc.digitool.pid26801
dc.digitool.pid26800
dc.digitool.pid26802
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreePhD
dc.relation.departmentDept. of Chemical and Biological Engineering


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