Plasma deposition and X-ray reflectivity characterization of graded ultra high barrier coatings

dc.rights.license	Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.
dc.contributor	Persans, Peter D., 1953-
dc.contributor	Lee, Susanne M.
dc.contributor	Eah, Sang-Kee
dc.contributor	Stoler, Paul
dc.contributor	Schroeder, John
dc.contributor	Plawsky, Joel L., 1957-
dc.contributor.author	Scherer, Brian Joseph
dc.date.accessioned	2021-11-03T10:09:48Z
dc.date.available	2021-11-03T10:09:48Z
dc.date.created	2011-06-09T09:14:07Z
dc.date.issued	2011-05
dc.identifier.uri	https://hdl.handle.net/20.500.13015/3245
dc.description	May 2011
dc.description	School of Science
dc.language.iso	ENG
dc.publisher	Rensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartof	Rensselaer Theses and Dissertations Online Collection
dc.subject	Physics
dc.title	Plasma deposition and X-ray reflectivity characterization of graded ultra high barrier coatings
dc.type	Electronic thesis
dc.type	Thesis
dc.digitool.pid	28926
dc.digitool.pid	28927
dc.digitool.pid	28929
dc.digitool.pid	28928
dc.digitool.pid	28930
dc.rights.holder	This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degree	PhD
dc.relation.department	Dept. of Physics, Applied Physics, and Astronomy

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