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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.
dc.contributorPersans, Peter D., 1953-
dc.contributorLee, Susanne M.
dc.contributorEah, Sang-Kee
dc.contributorStoler, Paul
dc.contributorSchroeder, John
dc.contributorPlawsky, Joel L., 1957-
dc.contributor.authorScherer, Brian Joseph
dc.date.accessioned2021-11-03T10:09:48Z
dc.date.available2021-11-03T10:09:48Z
dc.date.created2011-06-09T09:14:07Z
dc.date.issued2011-05
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3245
dc.descriptionMay 2011
dc.descriptionSchool of Science
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectPhysics
dc.titlePlasma deposition and X-ray reflectivity characterization of graded ultra high barrier coatings
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid28926
dc.digitool.pid28927
dc.digitool.pid28929
dc.digitool.pid28928
dc.digitool.pid28930
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreePhD
dc.relation.departmentDept. of Physics, Applied Physics, and Astronomy


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