Methods for automated analysis of curvilinear structures in three-dimensional and spatio-temporal microscopy images using orientation distribution functions

Authors
Mukherjee, Amit
ORCID
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Other Contributors
Roysam, Badrinath
Wozny, M. J. (Michael J.)
Stewart, Charles V.
Radke, Richard J., 1974-
Issue Date
2011-05
Keywords
computer , Systems engineering , Electrical
Degree
PhD
Terms of Use
Attribution-NonCommercial-NoDerivs 3.0 United States
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
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Abstract
Description
May 2011
School of Engineering
Center for Subsurface Sensing and Imaging Systems
Department
Dept. of Electrical, Computer, and Systems Engineering
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
Access
CC BY-NC-ND. Users may download and share copies with attribution in accordance with a Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License. No commercial use or derivatives are permitted without the explicit approval of the author.