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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.
dc.contributorRamanath, G. (Ganpati)
dc.contributorGall, Daniel
dc.contributorHuang, Liping
dc.contributorKoratkar, Nikhil A. A.
dc.contributorLane, Michael W.
dc.contributor.authorGarg, Saurabh
dc.date.accessioned2021-11-03T10:12:06Z
dc.date.available2021-11-03T10:12:06Z
dc.date.created2011-06-29T15:05:22Z
dc.date.issued2011-08
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3306
dc.descriptionAugust 2011
dc.descriptionSchool of Engineering
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectMaterials science and engineering
dc.titleChemistry-property relationships at molecularly modified copper-silica interfaces
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid29464
dc.digitool.pid29465
dc.digitool.pid29467
dc.digitool.pid29466
dc.digitool.pid29468
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreePhD
dc.relation.departmentDept. of Materials Science and Engineering


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