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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.
dc.contributorLewis, Kim M.
dc.contributorKeblinski, Pawel
dc.contributor.authorMao, Jiwang
dc.date.accessioned2021-11-03T10:15:19Z
dc.date.available2021-11-03T10:15:19Z
dc.date.created2011-09-26T12:25:43Z
dc.date.issued2011-08
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3379
dc.descriptionAugust 2011
dc.descriptionSchool of Engineering
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectMaterials engineering
dc.titleConductance of redox-active single molecule junctions measured by electrochemical scanning tunneling microscopy
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid30875
dc.digitool.pid30876
dc.digitool.pid30878
dc.digitool.pid30877
dc.digitool.pid30879
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Materials Science and Engineering


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