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    Degradation modeling using threshold exceedance data

    Author
    Fan, Hui
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    5795_fan_tpab.pdf (63.91Kb)
    5796_fan_diss.pdf (2.368Mb)
    Other Contributors
    Willemain, Thomas R.; Osborn, Brock E.; Sullo, Pasquale; Paulson, A. S.; Chan, Wai Kin (Victor);
    Date Issued
    2007-05
    Subject
    Systems engineering
    Degree
    PhD;
    Terms of Use
    This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.;
    Metadata
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    URI
    https://hdl.handle.net/20.500.13015/3767
    Abstract
    Description
    May 2007; School of Engineering
    Department
    Dept. of Decision Sciences and Engineering Systems;
    Publisher
    Rensselaer Polytechnic Institute, Troy, NY
    Relationships
    Rensselaer Theses and Dissertations Online Collection;
    Access
    Restricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.;
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    • RPI Theses Online (Complete)

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