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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorLu, T.-M. (Toh-Ming), 1943-
dc.contributorWang, G.-C. (Gwo-Ching), 1946-
dc.contributorKorniss, Gyorgy
dc.contributor.authorPelliccione, Matthew J.
dc.date.accessioned2021-11-03T10:43:28Z
dc.date.available2021-11-03T10:43:28Z
dc.date.created2007-06-14T11:51:27Z
dc.date.issued2007-05
dc.identifier.urihttps://hdl.handle.net/20.500.13015/3818
dc.descriptionMay 2007
dc.descriptionSchool of Science
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectPhysics
dc.titleEvolution of thin film morphology - modeling and simulations
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid6290
dc.digitool.pid6291
dc.digitool.pid6293
dc.digitool.pid6292
dc.digitool.pid6294
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Physics, Applied Physics, and Astronomy


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