Browsing RPI Theses Open Access by Author "Ogden, Sean P."
Now showing items 1-1 of 1
-
Breakdown and reliability of nanoscale dielectric films
Ogden, Sean P. (Rensselaer Polytechnic Institute, Troy, NY, 2017-12)The model equations are refined to expand its failure prediction capabilities. The electron temperature is re-defined solely as a function of the electric field, and the defect generation rate is more closely aligned with ...