Investigation of temperature effectson GaN MOS capacitors and field-effect transistors
Authors
Zhang, Jie
ORCID
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Other Contributors
Chow, T. Paul
Bhat, Ishwara B.
Connor, Kenneth A.
Bhat, Ishwara B.
Connor, Kenneth A.
Issue Date
2012-08
Keywords
Electrical engineering
Degree
MS
Terms of Use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
Full Citation
Abstract
Description
August 2012
School of Engineering
Smart Lighting Engineering Research Center
School of Engineering
Smart Lighting Engineering Research Center
Department
Dept. of Electrical, Computer, and Systems Engineering
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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