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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorWang, G.-C. (Gwo-Ching), 1946-
dc.contributorLu, T.-M. (Toh-Ming), 1943-
dc.contributorBhat, Ishwara B.
dc.contributor.authorYuan, Wen
dc.date.accessioned2021-11-03T07:52:29Z
dc.date.available2021-11-03T07:52:29Z
dc.date.created2008-12-15T13:09:25Z
dc.date.issued2008-12
dc.identifier.urihttps://hdl.handle.net/20.500.13015/704
dc.descriptionDecember 2008
dc.descriptionSchool of Science
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectPhysics
dc.titleCharacterization of CdTe/CaF2 thin film
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid14197
dc.digitool.pid14198
dc.digitool.pid14200
dc.digitool.pid14199
dc.digitool.pid14201
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Physics, Applied Physics, and Astronomy


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