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dc.rights.licenseUsers may download and share copies with attribution in accordance with a Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License. No commercial use or derivatives are permitted without the explicit approval of the author.
dc.contributorShur, Michael
dc.contributor.authorBhalerao, Shantanu A.
dc.date.accessioned2021-11-03T07:53:18Z
dc.date.available2021-11-03T07:53:18Z
dc.date.created2008-12-19T10:27:14Z
dc.date.issued2008-12
dc.identifier.urihttps://hdl.handle.net/20.500.13015/735
dc.descriptionDecember 2008
dc.descriptionSchool of Engineering
dc.description.abstractThe thesis presents modeling of capacitance-voltage characteristics of thin film transistors and thermal analysis of self-heating effects in thin film transistors and transistor arrays. The parameter extraction from C-V measurements is described and the limitations of the C-V characterization are discussed. The distributive nature of the capacitance in the device channel is shown to account for the capacitance frequency dispersion. To zero order, this effect can be reproduced by a lumped element equivalent circuit proposed by Elmore (the Elmore model) and by a new Variable Dispersion Model (VDM) accounting for finite interaction time between traps and states above the mobility edge. VDM has been developed and implemented in AIM-Spice. The combined VDM-Elmore model is shown to reproduce the entire dispersion observed in printed TFTs. Dynamic thermal simulations for an amorphous Si TFT show that the temperature rise due to self heating can be noticeable (a few degrees for relatively short interconnects). We also present the dynamic thermal circuit for a TFT pixel that was simulated in Spice.
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectElectrical engineering
dc.titleModeling and characterization of amorphous silicon thin film transistors
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid14356
dc.digitool.pid14357
dc.digitool.pid14359
dc.digitool.pid14358
dc.digitool.pid14360
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Electrical, Computer, and Systems Engineering


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