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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorSaulnier, Gary J.
dc.contributorHolmes, Timothy
dc.contributor.authorSwoboda, John
dc.date.accessioned2021-11-03T07:53:49Z
dc.date.available2021-11-03T07:53:49Z
dc.date.created2009-01-22T10:32:10Z
dc.date.issued2008-05
dc.identifier.urihttps://hdl.handle.net/20.500.13015/750
dc.descriptionMay 2008
dc.descriptionSchool of Engineering
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectElectrical engineering
dc.titleReconstruction of tomographic images corrupted by a slice sensitivity profile with applications to the inspection of manufactured items
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid14511
dc.digitool.pid14512
dc.digitool.pid14514
dc.digitool.pid14513
dc.digitool.pid14515
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Electrical, Computer, and Systems Engineering


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