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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Research Libraries.
dc.contributorWang, G.-C. (Gwo-Ching), 1946-
dc.contributorBorca-Tasçiuc, Theodorian
dc.contributorLu, T.-M. (Toh-Ming), 1943-
dc.contributor.authorWu, Min
dc.date.accessioned2021-11-03T07:57:13Z
dc.date.available2021-11-03T07:57:13Z
dc.date.created2009-05-04T13:12:31Z
dc.date.issued2009-05
dc.identifier.urihttps://hdl.handle.net/20.500.13015/811
dc.descriptionMay 2009
dc.descriptionSchool of Science
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectPhysics
dc.titleThermal conductivity measurement of microwires and nanowires using three omega method and scanning probe microscopy
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid16668
dc.digitool.pid16669
dc.digitool.pid16671
dc.digitool.pid16670
dc.digitool.pid16672
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentDept. of Physics, Applied Physics, and Astronomy


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