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dc.rights.licenseRestricted to current Rensselaer faculty, staff and students. Access inquiries may be directed to the Rensselaer Libraries.
dc.contributorXiang, Ning
dc.contributorBraasch, Jonas
dc.contributorMarkov, Ivan
dc.contributor.authorSchmitt, Andrew Alexander Joseph
dc.date.accessioned2021-11-03T08:01:58Z
dc.date.available2021-11-03T08:01:58Z
dc.date.created2014-01-16T11:26:26Z
dc.date.issued2013-08
dc.identifier.urihttps://hdl.handle.net/20.500.13015/948
dc.descriptionAugust 2013
dc.descriptionSchool of Architecture
dc.description.abstractFirst described by the late acoustician Dah-You Maa, micro-perforated panel (MPP) absorbers produce extremely high acoustic absorption coefficients. This is done without the use of conventional fibrous or porous materials that are often used in acoustic treatments, meaning MPP absorbers are capable of being implemented and withstanding critical situations where traditional absorbers do not suffice. The absorption function of a micro-perforated panel yields high yet relatively narrow results at certain frequencies, although wide-band absorption can be designed by stacking multiple MPP absorbers comprised of different characteristic parameters. Using Bayesian analysis, the physical properties of panel thickness, pore diameter, perforation ratio, and air depth are estimated inversely from experimental data of acoustic absorption, based on theoretical models for design of micro-perforated panels. Furthermore, this analysis helps to understand the interdependence and uncertainties of the parameters and how each affects the performance of the panel. Various micro-perforated panels are manufactured and tested in single- and double-layer absorber constructions.
dc.language.isoENG
dc.publisherRensselaer Polytechnic Institute, Troy, NY
dc.relation.ispartofRensselaer Theses and Dissertations Online Collection
dc.subjectArchitectural sciences
dc.titleBayesian characterization of micro-perforated panels and multi-layer absorbers
dc.typeElectronic thesis
dc.typeThesis
dc.digitool.pid170014
dc.digitool.pid170015
dc.digitool.pid170016
dc.rights.holderThis electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
dc.description.degreeMS
dc.relation.departmentSchool of Architecture


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