High speed reconfigurable circuits and data converters for communication systems in SiGe HBT technology

LeRoy, Mitchell R.
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McDonald, John F. (John Francis), 1942-
Lewis, Kim M.
Saulnier, Gary J.
Zhang, Tong
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Electrical engineering
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An 8-bit two-step flash ADC is designed for use in a fast time interleaved converter. The two-step approach greatly reduces power and area by splitting the conversion process into two smaller flash steps. A 40 Gs/s four-way time interleaved converter with a front sample-and-hold amplifier is developed to push the sampling speed of the conversion. A clock generation strategy for time interleaving is described and presented. A new distributed sample-and-hold amplifier is developed to further increase sample rates. To test the time interleaved converter an 8-bit R2R digital-to-analog (DAC) converter is also designed. The ADC and DAC were fabricated on a 3.0 mm by 3.4 mm test die in 9HP and verified on both a room temperature probe stand at 300 K and in a cryogenic test stand at 77 K. This is the first demonstration of tens of thousands of SiGe transistors on a die functioning at liquid nitrogen temperature. The cryogenic testing process and required equipment are also explored and discussed.
May 2016
School of Engineering
Dept. of Electrical, Computer, and Systems Engineering
Rensselaer Polytechnic Institute, Troy, NY
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