Degradation modeling using threshold exceedance data

Authors
Fan, Hui
ORCID
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Other Contributors
Willemain, Thomas R.
Osborn, Brock E.
Sullo, Pasquale
Paulson, A. S.
Chan, Wai Kin (Victor)
Issue Date
2007-05
Keywords
Systems engineering
Degree
PhD
Terms of Use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
Full Citation
Abstract
Description
May 2007
School of Engineering
Department
Dept. of Decision Sciences and Engineering Systems
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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