Coupled volume analysis with a high resolution measurement system

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Authors
Lee, Joonhee
Issue Date
2009-12
Type
Electronic thesis
Thesis
Language
ENG
Keywords
Architectural sciences
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Abstract
Description
December 2009
School of Architecture
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Publisher
Rensselaer Polytechnic Institute, Troy, NY
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https://hdl.handle.net/20.500.13015/2827
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RPI Theses Online (Complete)