Numerical study of electromigration in passivated interconnects

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Authors
Ge, Youzhang
Issue Date
2010-05
Type
Electronic thesis
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Language
ENG
Keywords
Mechanical engineering
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Abstract
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May 2010
School of Engineering
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Rensselaer Polytechnic Institute, Troy, NY
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https://hdl.handle.net/20.500.13015/3023
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RPI Theses Online (Complete)