Development of a scanning electron microscopy based temperature measurement technique

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Authors
Wu, Xiaowei
Issue Date
2013-12
Type
Electronic thesis
Thesis
Language
ENG
Keywords
Materials science and engineering
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Abstract
A Debye-Waller Factor based theory is used to calculate the backscattered electron intensity variations with temperature which are compared with the experimental measurement. The parameters used for the analytical calculation for different materials are experimentally obtained by inelastic neutron scattering from literature. The experimental data agrees with the analytical calculation and the behavior of the temperature signal employed in this technique is consistent with the thermal diffuse scattering theory.
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December 2013
School of Engineering
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Rensselaer Polytechnic Institute, Troy, NY
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