Development of a scanning electron microscopy based temperature measurement technique

Authors
Wu, Xiaowei
ORCID
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Other Contributors
Hull, Robert, 1959-
Gall, Daniel
Keblinski, Pawel
Wang, G.-C. (Gwo-Ching), 1946-
Issue Date
2013-12
Keywords
Materials science and engineering
Degree
PhD
Terms of Use
This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
Full Citation
Abstract
A Debye-Waller Factor based theory is used to calculate the backscattered electron intensity variations with temperature which are compared with the experimental measurement. The parameters used for the analytical calculation for different materials are experimentally obtained by inelastic neutron scattering from literature. The experimental data agrees with the analytical calculation and the behavior of the temperature signal employed in this technique is consistent with the thermal diffuse scattering theory.
Description
December 2013
School of Engineering
Department
Dept. of Materials Science and Engineering
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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