Electron diffraction from two dimensional materials

Authors
Xiang, Yu
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Other Contributors
Wang, G.-C. (Gwo-Ching), 1946-
Lu, T.-M. (Toh-Ming), 1943-
Terrones, H. (Humberto)
Shi, Jian
Issue Date
2019-12
Keywords
Physics
Degree
PhD
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This electronic version is a licensed copy owned by Rensselaer Polytechnic Institute, Troy, NY. Copyright of original work retained by author.
Full Citation
Abstract
The HRLEED study of single crystal graphene on Cu(111) reveals that diffraction peaks have very similar full-width-at-half-maximums but the average broadening is significantly (~three times) larger than the instrument response (~0.03 Å<sup>-1</sup>). This suggests a noticeable number of defects exist within both graphene and copper surface. From the LEED IV curve after an inner potential correction, the graphene to Cu(111) surface distance is estimated to be d = 3.49 ± 0.01 Å. This value is close to that (d = 3.27 ± 0.07 Å) determined by RHEED from multilayer graphene and the interlayer spacing of 3.36 Å in graphite. This suggests that the coupling between graphene and Cu metal is similar to a pure van der Waals interaction.
Description
December 2019
School of Science
Department
Dept. of Physics, Applied Physics, and Astronomy
Publisher
Rensselaer Polytechnic Institute, Troy, NY
Relationships
Rensselaer Theses and Dissertations Online Collection
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