Electron diffraction from two dimensional materials

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Authors
Xiang, Yu
Issue Date
2019-12
Type
Electronic thesis
Thesis
Language
ENG
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Physics
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Abstract
The HRLEED study of single crystal graphene on Cu(111) reveals that diffraction peaks have very similar full-width-at-half-maximums but the average broadening is significantly (~three times) larger than the instrument response (~0.03 Å<sup>-1</sup>). This suggests a noticeable number of defects exist within both graphene and copper surface. From the LEED IV curve after an inner potential correction, the graphene to Cu(111) surface distance is estimated to be d = 3.49 ± 0.01 Å. This value is close to that (d = 3.27 ± 0.07 Å) determined by RHEED from multilayer graphene and the interlayer spacing of 3.36 Å in graphite. This suggests that the coupling between graphene and Cu metal is similar to a pure van der Waals interaction.
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December 2019
School of Science
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Rensselaer Polytechnic Institute, Troy, NY
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