Reconstruction of tomographic images corrupted by a slice sensitivity profile with applications to the inspection of manufactured items
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Authors
Swoboda, John
Issue Date
2008-05
Type
Electronic thesis
Thesis
Thesis
Language
ENG
Keywords
Electrical engineering
Alternative Title
Abstract
Description
May 2008
School of Engineering
School of Engineering
Full Citation
Publisher
Rensselaer Polytechnic Institute, Troy, NY