Growth and characterization of epitaxial Ge on As-passivated (211)Si by chemical vapor deposition for HgCdTe based infrared detector applications

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Authors
Shintri, Shashidhar S
Issue Date
2011-05
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Electronic thesis
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Language
ENG
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Electrical engineering
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May 2011
School of Engineering
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Rensselaer Polytechnic Institute, Troy, NY
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